Publication:

Automated Software Defect Detection and Identification in Vehicular Embedded Systems

Date

2022
Journal article
https://doi.org/10.1109/TITS.2021.3065940
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dc.contributor.authorFoss, Kyle
dc.contributor.authorCouckuyt, Ivo
dc.contributor.authorBaruta, Adrian
dc.contributor.authorMossoux, Corentin
dc.contributor.imecauthorFoss, Kyle
dc.contributor.imecauthorCouckuyt, Ivo
dc.contributor.orcidimecCouckuyt, Ivo::0000-0002-9524-4205
dc.date.accessioned2022-08-30T10:25:57Z
dc.date.available2021-12-29T02:06:41Z
dc.date.available2022-08-30T10:25:57Z
dc.date.embargo2022-07-31
dc.date.issued2022
dc.description.wosFundingTextThis work was supported in part by the Electronic Components and Systems for European Leadership (ECSEL) Joint Undertaking through ENABLE-S3 Project under Agreement 692455 and in part by the Flemish Government under the "Onderzoeksprogramma Artificiele Intelligentie (AI) Vlaanderen" Program. This joint undertaking receives support from the European Union's Horizon 2020 Research and Innovation Program and Austria, Denmark, Germany, Finland, Czech Republic, Italy, Spain, Portugal, Poland, Ireland, Belgium, France, The Netherlands, U.K., Slovakia, Norway.
dc.identifier.doi10.1109/TITS.2021.3065940
dc.identifier.issn1524-9050
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38681
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage6963
dc.source.endpage6973
dc.source.issue7
dc.source.journalIEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS
dc.source.numberofpages11
dc.source.volume23
dc.subject.keywordsVERIFICATION
dc.subject.keywordsALGORITHM
dc.subject.keywordsDESIGN
dc.title

Automated Software Defect Detection and Identification in Vehicular Embedded Systems

dc.typeJournal article
dspace.entity.typePublication
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