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A 1.8-65 fJ/Conv.-Step 64-dB SNDR Continuous-Time Level Crossing ADC Exploiting Dynamic Self-Biasing Comparators

 
dc.contributor.authorTimmermans, Martijn
dc.contributor.authorvan Oosterhout, Kyle
dc.contributor.authorFattori, Marco
dc.contributor.authorHarpe, Pieter
dc.contributor.authorLiu, Yao-Hong
dc.contributor.authorCantatore, Eugenio
dc.contributor.imecauthorLiu, Yao-Hong
dc.contributor.orcidimecLiu, Yao-Hong::0000-0002-3256-6741
dc.date.accessioned2024-11-07T12:57:30Z
dc.date.available2024-03-10T17:32:02Z
dc.date.available2024-11-07T12:57:30Z
dc.date.issued2024
dc.description.wosFundingTextNo Statement Available
dc.identifier.doi10.1109/JSSC.2024.3352735
dc.identifier.issn0018-9200
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43665
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage1194
dc.source.endpage1203
dc.source.issue1
dc.source.journalIEEE JOURNAL OF SOLID-STATE CIRCUITS
dc.source.numberofpages10
dc.source.volume59
dc.subject.keywordsEVENT-DRIVEN
dc.title

A 1.8-65 fJ/Conv.-Step 64-dB SNDR Continuous-Time Level Crossing ADC Exploiting Dynamic Self-Biasing Comparators

dc.typeJournal article
dspace.entity.typePublication
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