Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Reliability engineering enabling continued logic for memory device scaling
Publication:
Reliability engineering enabling continued logic for memory device scaling
Date
2019
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
O'Sullivan, Barry
;
Ritzenthaler, Romain
;
Dentoni Litta, Eugenio
;
Simoen, Eddy
;
Machkaoutsan, Vladimir
;
Fazan, Pierre
;
Ji, Yunhyuck
;
Kim, Cheolgyu
;
Spessot, Alessio
;
Linten, Dimitri
;
Horiguchi, Naoto
Journal
Abstract
Description
Metrics
Views
1867
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations
Metrics
Views
1867
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations