Publication:
Sub-nanometer characterization of nanoelectronic devices
Date
| dc.contributor.author | Eyben, Pierre | |
| dc.contributor.author | Mody, Jay | |
| dc.contributor.author | Nazir, Aftab | |
| dc.contributor.author | Schulze, Andreas | |
| dc.contributor.author | Clarysse, Trudo | |
| dc.contributor.author | Hantschel, Thomas | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Eyben, Pierre | |
| dc.contributor.imecauthor | Nazir, Aftab | |
| dc.contributor.imecauthor | Hantschel, Thomas | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
| dc.date.accessioned | 2021-10-21T07:33:31Z | |
| dc.date.available | 2021-10-21T07:33:31Z | |
| dc.date.issued | 2013 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22328 | |
| dc.identifier.url | http://www.crcpress.com/product/isbn/9781466505094 | |
| dc.source.book | Fundamentals of Picoscience | |
| dc.title | Sub-nanometer characterization of nanoelectronic devices | |
| dc.type | Book chapter | |
| dspace.entity.type | Publication | |
| Files | ||
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