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Switching Activity Factor-Based ECSM Characterization (SAFE): A Novel Technique for Aging-Aware Static Timing Analysis

 
dc.contributor.authorAcharya, Lomash Chandra
dc.contributor.authorSharma, Arvind
dc.contributor.authorMishra, Neeraj
dc.contributor.authorSingh, Khoirom Johnson
dc.contributor.authorDargupally, Mahipal
dc.contributor.authorGupta, Neha
dc.contributor.authorShabarish, Nayakanti Sai
dc.contributor.authorMandal, Ajoy
dc.contributor.authorRamakrishnan, Venkatraman
dc.contributor.authorDasgupta, Sudeb
dc.contributor.authorBulusu, Anand
dc.contributor.imecauthorSharma, Arvind
dc.contributor.imecauthorMishra, Neeraj
dc.contributor.orcidimecSharma, Arvind::0000-0003-1188-4924
dc.contributor.orcidimecMishra, Neeraj::0000-0003-3276-3777
dc.date.accessioned2025-04-30T09:21:54Z
dc.date.available2024-12-03T16:44:53Z
dc.date.available2025-04-30T09:21:54Z
dc.date.issued2024
dc.description.wosFundingTextThis work was supported in part by Semiconductor Research Corporation (SRC) under IRP Task: 2864.001. This article was recommended by Associate Editor C.-K. Cheng.
dc.identifier.doi10.1109/TCAD.2024.3396432
dc.identifier.issn0278-0070
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44910
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage4715
dc.source.endpage4725
dc.source.issue12
dc.source.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
dc.source.numberofpages11
dc.source.volume43
dc.subject.keywordsCMOS INVERTER
dc.subject.keywordsDESIGN
dc.subject.keywordsNBTI
dc.subject.keywordsMODEL
dc.subject.keywordsTEMPERATURE
dc.subject.keywordsRELIABILITY
dc.subject.keywordsCIRCUITS
dc.title

Switching Activity Factor-Based ECSM Characterization (SAFE): A Novel Technique for Aging-Aware Static Timing Analysis

dc.typeJournal article
dspace.entity.typePublication
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