Publication:

Danger, high voltage! Using EEG and EOG measurements for cognitive overload detection in a simulated industrial context

 
dc.contributor.authorMorton, Jessica
dc.contributor.authorZheleva, Aleksandra
dc.contributor.authorVan Acker, Bram
dc.contributor.authorDurnez, Wouter
dc.contributor.authorVanneste, Pieter
dc.contributor.authorLarmuseau, Charlotte
dc.contributor.authorDe Bruyne, Jonas
dc.contributor.authorRaes, Annelies
dc.contributor.authorCornillie, Frederik
dc.contributor.authorSaldien, Jelle
dc.contributor.authorDe Marez, Lieven
dc.contributor.authorBombeke, Klaas
dc.contributor.imecauthorMorton, Jessica
dc.contributor.imecauthorZheleva, Aleksandra
dc.contributor.imecauthorVan Acker, Bram
dc.contributor.imecauthorDurnez, Wouter
dc.contributor.imecauthorVanneste, Pieter
dc.contributor.imecauthorLarmuseau, Charlotte
dc.contributor.imecauthorDe Bruyne, Jonas
dc.contributor.imecauthorRaes, Annelies
dc.contributor.imecauthorCornillie, Frederik
dc.contributor.imecauthorSaldien, Jelle
dc.contributor.imecauthorDe Marez, Lieven
dc.contributor.imecauthorBombeke, Klaas
dc.contributor.orcidimecMorton, Jessica::0000-0002-2677-478X
dc.contributor.orcidimecZheleva, Aleksandra::0000-0003-3478-4969
dc.contributor.orcidimecVan Acker, Bram::0000-0002-6565-3569
dc.contributor.orcidimecDurnez, Wouter::0000-0001-8045-8801
dc.contributor.orcidimecVanneste, Pieter::0000-0002-3355-5294
dc.contributor.orcidimecDe Bruyne, Jonas::0000-0002-6077-6084
dc.contributor.orcidimecRaes, Annelies::0000-0001-9237-9385
dc.contributor.orcidimecCornillie, Frederik::0000-0002-4820-7970
dc.contributor.orcidimecSaldien, Jelle::0000-0003-2557-3764
dc.contributor.orcidimecDe Marez, Lieven::0000-0001-7716-4079
dc.contributor.orcidimecBombeke, Klaas::0000-0003-2056-1246
dc.date.accessioned2022-09-01T13:32:46Z
dc.date.available2022-06-11T02:21:48Z
dc.date.available2022-09-01T13:32:46Z
dc.date.issued2022
dc.identifier.doi10.1016/j.apergo.2022.103763
dc.identifier.issn0003-6870
dc.identifier.pmidMEDLINE:35405457
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39942
dc.publisherELSEVIER SCI LTD
dc.source.beginpage103763
dc.source.issuena
dc.source.journalAPPLIED ERGONOMICS
dc.source.numberofpages9
dc.source.volume102
dc.subject.keywordsMENTAL WORKLOAD
dc.subject.keywordsWORKING-MEMORY
dc.subject.keywordsWIRELESS EEG
dc.subject.keywordsPERFORMANCE
dc.subject.keywordsTASK
dc.subject.keywordsALPHA
dc.subject.keywordsLOAD
dc.subject.keywordsOSCILLATIONS
dc.subject.keywordsOPERATORS
dc.subject.keywordsINDEXES
dc.title

Danger, high voltage! Using EEG and EOG measurements for cognitive overload detection in a simulated industrial context

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections: