Publication:
Understanding the Self-Heating Effects Measured With the AC Output Conductance Method in Advanced FinFET Nodes
| dc.contributor.author | Tondelli, L. | |
| dc.contributor.author | Asanovski, Ruben | |
| dc.contributor.author | Scholten, A. J. | |
| dc.contributor.author | Dinh, T. V. | |
| dc.contributor.author | Tam, S. -W. | |
| dc.contributor.author | Pijper, R. M. T. | |
| dc.contributor.author | Selmi, L. | |
| dc.contributor.imecauthor | Asanovski, Ruben | |
| dc.contributor.orcidimec | Asanovski, Ruben::0000-0001-7127-6184 | |
| dc.date.accessioned | 2025-07-10T13:31:42Z | |
| dc.date.available | 2024-10-26T16:45:25Z | |
| dc.date.available | 2025-07-10T13:31:42Z | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | This work was supported by European Union through the Next Generation EU Program, Italian PNRR M4C21.5 action, ECOSISTER Project, SP6 WP2. The review of this article was arranged by Editor E. A. Gutierrez-D. | |
| dc.identifier.doi | 10.1109/TED.2024.3469187 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44684 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 6976 | |
| dc.source.endpage | 6982 | |
| dc.source.issue | 11 | |
| dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| dc.source.numberofpages | 7 | |
| dc.source.volume | 71 | |
| dc.subject.keywords | EXTRACTION | |
| dc.subject.keywords | ALGAN/GAN | |
| dc.subject.keywords | DEVICES | |
| dc.title | Understanding the Self-Heating Effects Measured With the AC Output Conductance Method in Advanced FinFET Nodes | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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