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Highly Localized Charges of Confined Electrical Double-Layers Inside 0.7-nm Layered Channels

 
dc.contributor.authorChen, Bin
dc.contributor.authorZhai, Zhaofeng
dc.contributor.authorHuang, Nan
dc.contributor.authorZhang, Chuyan
dc.contributor.authorYu, Siyu
dc.contributor.authorLiu, Lusheng
dc.contributor.authorYang, Bing
dc.contributor.authorJiang, Xin
dc.contributor.authorYang, Nianjun
dc.date.accessioned2024-02-01T09:39:16Z
dc.date.available2023-08-21T18:00:49Z
dc.date.available2024-02-01T09:39:16Z
dc.date.issued2023
dc.description.wosFundingTextThe authors thank for Prof. Zhongshuai Wu in Dalian Institute of Chemical Physics, Chinese Academy of Sciences and Prof. Bingsen Zhang in Institute of Metal Research, Chinese Academy of Sciences for the discussion of the electrical double-layer capacitance. This work was supported by the National Natural Science Foundation of China (No. 51202257) and N. Y. thanks the financial support from Deutsche Forschungsgemeinschaft (DFG, German Research Foundation, No. 457444676).
dc.identifier.doi10.1002/aenm.202300716
dc.identifier.issn1614-6832
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42379
dc.publisherWILEY-V C H VERLAG GMBH
dc.source.beginpageArt. 2300716
dc.source.endpageN/A
dc.source.issue36
dc.source.journalADVANCED ENERGY MATERIALS
dc.source.numberofpages11
dc.source.volume13
dc.subject.keywordsQUARTZ-CRYSTAL MICROBALANCE
dc.subject.keywordsION DYNAMICS
dc.subject.keywordsINTERCALATION
dc.subject.keywordsCAPACITANCE
dc.subject.keywordsGRAPHITE
dc.subject.keywordsSTORAGE
dc.subject.keywordsSIZE
dc.subject.keywordsNMR
dc.title

Highly Localized Charges of Confined Electrical Double-Layers Inside 0.7-nm Layered Channels

dc.typeJournal article
dspace.entity.typePublication
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