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A novel approach to analyse FTIR spectra of precipitates in moderately and heavily doped silicon

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dc.contributor.authorDe Gryse, O.
dc.contributor.authorVanhellemont, J.
dc.contributor.authorClauws, P.
dc.contributor.authorLebedev, O.
dc.contributor.authorVan Landuyt, J.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-15T04:18:49Z
dc.date.available2021-10-15T04:18:49Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7408
dc.source.beginpage1013
dc.source.endpage1017
dc.source.journalPhysica B
dc.source.volume340-342
dc.title

A novel approach to analyse FTIR spectra of precipitates in moderately and heavily doped silicon

dc.typeJournal article
dspace.entity.typePublication
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