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A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication

 
dc.contributor.authorKruv, Anastasiia
dc.contributor.authorGonzalez, Mario
dc.contributor.authorOkudur, Oguzhan Orkut
dc.contributor.authorSpampinato, Valentina
dc.contributor.authorFranquet, Alexis
dc.contributor.authorVadakupudhu Palayam, Senthil
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.imecauthorKruv, Anastasiia
dc.contributor.imecauthorGonzalez, Mario
dc.contributor.imecauthorOkudur, Oguzhan Orkut
dc.contributor.imecauthorSpampinato, Valentina
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorVadakupudhu Palayam, Senthil
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecGonzalez, Mario::0000-0003-4374-4854
dc.contributor.orcidimecOkudur, Oguzhan Orkut::0000-0002-4790-7772
dc.contributor.orcidimecSpampinato, Valentina::0000-0003-3225-6740
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimecVadakupudhu Palayam, Senthil::0000-0002-0855-3377
dc.date.accessioned2023-08-07T11:22:06Z
dc.date.available2023-06-20T10:36:17Z
dc.date.available2023-08-07T11:22:06Z
dc.date.issued2022
dc.description.wosFundingTextThis research is supported by imec's Industrial Affiliation Program on Advanced Flash Memory devices. The authors acknowledge the contributions of T. Raymakers and K. Banerjee to this work.
dc.identifier.doi10.1016/j.mee.2021.111660
dc.identifier.issn0167-9317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41936
dc.publisherELSEVIER
dc.source.beginpageArt. 111660
dc.source.endpagena
dc.source.issueFebruary
dc.source.journalMICROELECTRONIC ENGINEERING
dc.source.numberofpages4
dc.source.volume254
dc.subject.keywordsELASTIC-MODULUS
dc.subject.keywordsTHIN-FILM
dc.subject.keywordsSUBSTRATE
dc.title

A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication

dc.typeJournal article
dspace.entity.typePublication
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