Publication:

Low-Field Memristive Switching in Epitaxially Strained SnS Thin Film

 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0001-7034-0500
cris.virtual.orcid0000-0003-3084-2543
cris.virtualsource.departmentcfd39499-a2de-4479-a67e-6768d3f22c8a
cris.virtualsource.department194c1e16-b354-4114-b246-36c079892667
cris.virtualsource.department77d06c14-6a7b-4d80-9c75-962dea483414
cris.virtualsource.orcidcfd39499-a2de-4479-a67e-6768d3f22c8a
cris.virtualsource.orcid194c1e16-b354-4114-b246-36c079892667
cris.virtualsource.orcid77d06c14-6a7b-4d80-9c75-962dea483414
dc.contributor.authorRohde, Michael
dc.contributor.authorRazeghi, Mohammadali
dc.contributor.authorSpiece, Jean
dc.contributor.authorHe, Gaohang
dc.contributor.authorCanetta, Alessandra
dc.contributor.authorFonck, Valentin
dc.contributor.authorMolina‐Lopez, Francisco
dc.contributor.authorMerckling, Clement
dc.contributor.authorGehring, Pascal
dc.contributor.orcidext0000-0003-1539-9715
dc.contributor.orcidext0000-0001-7034-0500
dc.contributor.orcidext0000-0003-0119-5615
dc.contributor.orcidext0009-0001-5544-9468
dc.contributor.orcidext0000-0002-4329-4059
dc.contributor.orcidext0000-0003-3084-2543
dc.date.accessioned2026-06-17T10:36:16Z
dc.date.available2026-06-17T10:36:16Z
dc.date.createdwos2025-12-14
dc.date.issued2026
dc.description.abstractThe quasi van der Waals (vdW) polarizable semiconductor, tin monosulfide (SnS), holds exceptional potential as a memristor in neuromorphic architectures as well as for sustainable, mechanically flexible and biocompatible photovoltaic and piezoelectric applications. So far, the synthesis of SnS remained limited to flake scale growth or subject to a compromise between substrate interaction and crystal order. In this work, this limitation is overcame by introducing a substrate pretreatment with reactive sulfur to a hybrid chemical/physical growth method. This approach achieves the sharply interfaced growth of a textured epitaxial SnS thin film directly on α-Al2O3 introducing in-plane strain and centrosymmetry breaking. These films possess stable and programmable memristive switching behavior with a switching field of 360 V cm−1, orders of magnitude lower than in previous studies on SnS. The interplay of epitaxially induced strain and symmetry breaking in SnS is thus demonstrated, paving the way for its thin film scale integration in the next generation of energy efficient and material-level adaptive electronics.
dc.description.wosFundingTextThe authors knowledge Chris Drijbooms and Olivier Richard for performing the TEM measurements and Anja Vanleenhove and Thierry Conard for performing XPS measurements. Furthermore, the authors acknowledge financial support from the F.R.S.-FNRS of Belgium (FNRS-CQ-1.C044.21-SMARD, FNRS-CDR-J.0068.21-SMARD, FNRS-MIS-F.4523.22-TopoBrain, FNRS-PDR-T.0128.24-ART-MULTI, FNRS-CR-1.B.463.22-MouleFrits, FNRS-FRIA-1.E092.23-TOTEM, FNRS-GEQ-UG.0102.2F-Attohmics), from the EU (ERC-StG-10104144-MOUNTAIN), from the Federation Wallonie-Bruxelles through the ARC Grant No. 21/26-116, and from the FWO and FRS-FNRS under the Excellence of Science (EOS) programme (40007563-CONNECT) and by KU Leuven Internal Funds Global PhD Partnerships with UC Louvain (GPUCL/21/021).
dc.identifier.doi10.1002/adfm.202508196
dc.identifier.eissn1616-3028
dc.identifier.issn1616-301X
dc.identifier.issn1616-3028
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59738
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherWILEY-V C H VERLAG GMBH
dc.source.beginpagee08196
dc.source.issue28
dc.source.journalADVANCED FUNCTIONAL MATERIALS
dc.source.numberofpages7
dc.source.volume36
dc.subject.keywordsMONOSULFIDE
dc.title

Low-Field Memristive Switching in Epitaxially Strained SnS Thin Film

dc.typeJournal article
dspace.entity.typePublication
imec.internal.crawledAt2025-12-11
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-04-07
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