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Intergate dielectric engineering towards large P/E window planar NAND flash
Publication:
Intergate dielectric engineering towards large P/E window planar NAND flash
Date
2015
Journal article
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29943.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Breuil, Laurent
;
Lisoni, Judit
;
Blomme, Pieter
;
Tan, Chi Lim
;
Van den Bosch, Geert
;
Van Houdt, Jan
Journal
IEEE Transactions on Electron Devices
Abstract
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1927
since deposited on 2021-10-22
Acq. date: 2025-10-22
Citations
Metrics
Views
1927
since deposited on 2021-10-22
Acq. date: 2025-10-22
Citations