Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
The impact of ALD TaN barrier processes on different BEOL utra low-k dielectrics
Publication:
The impact of ALD TaN barrier processes on different BEOL utra low-k dielectrics
Copy permalink
Date
2015
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Xunyuan
;
Gillot, Christophe
;
Zhao, Larry
;
Ryan, Todd
;
Wu, Chen
Journal
Abstract
Description
Metrics
Views
1878
since deposited on 2021-10-23
2
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1878
since deposited on 2021-10-23
2
last month
Acq. date: 2025-12-10
Citations