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Thermal Analysis of High-Performance Server SoCs from FinFET to Nanosheet Technologies

 
dc.contributor.authorKumar, Nitish
dc.contributor.authorSankatali, Venkateswarlu
dc.contributor.authorChen, Yukai
dc.contributor.authorBrunion, Moritz
dc.contributor.authorMishra, Subrat
dc.contributor.authorGupta, Ankur
dc.contributor.authorSingh, Pushpapraj
dc.contributor.authorCatthoor, Francky
dc.contributor.authorMyers, James
dc.contributor.authorRyckaert, Julien
dc.contributor.authorBiswas, Dwaipayan
dc.contributor.imecauthorKumar, Nitish
dc.contributor.imecauthorSankatali, Venkateswarlu
dc.contributor.imecauthorChen, Yukai
dc.contributor.imecauthorBrunion, Moritz
dc.contributor.imecauthorMishra, Subrat
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorMyers, James
dc.contributor.imecauthorRyckaert, Julien
dc.contributor.imecauthorBiswas, Dwaipayan
dc.contributor.orcidimecKumar, Nitish::0000-0002-9010-0712
dc.contributor.orcidimecSankatali, Venkateswarlu::0000-0002-1616-6764
dc.contributor.orcidimecChen, Yukai::0000-0003-3378-887X
dc.contributor.orcidimecBrunion, Moritz::0000-0001-7842-7774
dc.contributor.orcidimecMishra, Subrat::0000-0002-1435-3275
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecBiswas, Dwaipayan::0000-0002-1087-3433
dc.date.accessioned2024-09-19T14:56:29Z
dc.date.available2024-08-16T18:28:44Z
dc.date.available2024-09-19T14:56:29Z
dc.date.issued2024
dc.identifier.doi10.1109/IRPS48228.2024.10529472
dc.identifier.eisbn979-8-3503-6976-2
dc.identifier.isbn979-8-3503-6977-9
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44330
dc.publisherIEEE
dc.source.conferenceInternational Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 14-18, 2024
dc.source.conferencelocationGrapevine
dc.source.journalN/A
dc.source.numberofpages8
dc.title

Thermal Analysis of High-Performance Server SoCs from FinFET to Nanosheet Technologies

dc.typeProceedings paper
dspace.entity.typePublication
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