Publication:

Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy

 
dc.contributor.authorLagrain, Pieter
dc.contributor.authorPaulussen, Kris
dc.contributor.authorGrieten, Eva
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorRachidi, Sana
dc.contributor.authorYudistira, Didit
dc.contributor.authorWouters, Lennaert
dc.contributor.authorHantschel, Thomas
dc.contributor.imecauthorLagrain, Pieter
dc.contributor.imecauthorPaulussen, Kris
dc.contributor.imecauthorGrieten, Eva
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorRachidi, Sana
dc.contributor.imecauthorYudistira, Didit
dc.contributor.imecauthorWouters, Lennaert
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.orcidimecLagrain, Pieter::0000-0003-3734-7203
dc.contributor.orcidimecPaulussen, Kris::0000-0002-8945-2438
dc.contributor.orcidimecGrieten, Eva::0000-0001-6328-7633
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecRachidi, Sana::0000-0001-8581-8597
dc.contributor.orcidimecYudistira, Didit::0000-0003-1440-5407
dc.contributor.orcidimecWouters, Lennaert::0000-0002-6730-9542
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.date.accessioned2025-07-16T09:44:20Z
dc.date.available2024-08-17T18:27:29Z
dc.date.available2025-07-16T09:44:20Z
dc.date.embargo2024-03-26
dc.date.issued2024
dc.identifier.doi10.1016/j.mne.2024.100247
dc.identifier.issn2590-0072
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44343
dc.publisherELSEVIER
dc.source.beginpageArt. 100247
dc.source.endpageN/A
dc.source.issueJune
dc.source.journalMICRO AND NANO ENGINEERING
dc.source.numberofpages7
dc.source.volume23
dc.subject.keywordsSPECIMENS
dc.title

Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy

dc.typeJournal article
dspace.entity.typePublication
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