Publication:

Parasitic conduction response to X-ray radiation in unstrained and strained triple-gate SOI MuGFETs

Date

2014
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorTeixeira, Fernando
dc.contributor.authorBordallo, Caio
dc.contributor.authorSilveira, Marcilei
dc.contributor.authorAgopian, Paula
dc.contributor.authorMartino, Joao
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-22T06:30:22Z
dc.date.available2021-10-22T06:30:22Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.issn1807-1953
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24608
dc.identifier.urlhttp://www.sbmicro.org.br/jics/html/artigos/vol9no2/3.pdf
dc.source.beginpage97
dc.source.endpage102
dc.source.issue2
dc.source.journalJournal of Integrated Circuits and Systems
dc.source.volume9
dc.title

Parasitic conduction response to X-ray radiation in unstrained and strained triple-gate SOI MuGFETs

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
30092.pdf
Size:
718.95 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles