Publication:
Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-8186-071X | |
| cris.virtualsource.department | 0328af28-0868-452b-9c77-facda8733c82 | |
| cris.virtualsource.orcid | 0328af28-0868-452b-9c77-facda8733c82 | |
| dc.contributor.author | Amrouch, Hussam | |
| dc.contributor.author | van Santen, Victor M. | |
| dc.contributor.author | Diaz Fortuny, Javier | |
| dc.contributor.author | Klemme, Florian | |
| dc.contributor.imecauthor | Diaz-Fortuny, Javier | |
| dc.date.accessioned | 2024-08-16T18:29:16Z | |
| dc.date.available | 2024-08-16T18:29:16Z | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | This research was supported partially by Advantest as part of the Graduate School "Intelligent Methods for Test and Reliability" (GS-IMTR) at the University of Stuttgart. | |
| dc.identifier.doi | 10.1109/IRPS48228.2024.10529386 | |
| dc.identifier.eisbn | 979-8-3503-6976-2 | |
| dc.identifier.isbn | 979-8-3503-6977-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44332 | |
| dc.publisher | IEEE | |
| dc.source.conference | International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | 2024-04-14 | |
| dc.source.conferencelocation | Grapevine | |
| dc.source.numberofpages | 8 | |
| dc.subject.keywords | IMPACT | |
| dc.subject.keywords | VARIABILITY | |
| dc.subject.keywords | RELIABILITY | |
| dc.subject.keywords | PERFORMANCE | |
| dc.subject.keywords | DEGRADATION | |
| dc.subject.keywords | RECOVERY | |
| dc.subject.keywords | DEVICE | |
| dc.title | Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |