Publication:
Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures
Date
| dc.contributor.author | Michl, J. | |
| dc.contributor.author | Grasser, T. | |
| dc.contributor.author | Waltl, M. | |
| dc.contributor.author | Grill, Alexander | |
| dc.contributor.author | Bury, Erik | |
| dc.contributor.author | Tyaginov, Stanislav | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Parvais, Bertrand | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Radu, Iuliana | |
| dc.contributor.imecauthor | Grill, A. | |
| dc.contributor.imecauthor | Bury, E. | |
| dc.contributor.imecauthor | Tyaginov, S. | |
| dc.contributor.imecauthor | Linten, D. | |
| dc.contributor.imecauthor | Parvais, B. | |
| dc.contributor.imecauthor | Kaczer, B. | |
| dc.contributor.imecauthor | Radu, I | |
| dc.contributor.imecauthor | Grill, Alexander | |
| dc.contributor.imecauthor | Bury, Erik | |
| dc.contributor.imecauthor | Tyaginov, Stanislav | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Parvais, Bertrand | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Radu, Iuliana | |
| dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
| dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Radu, Iuliana::0000-0002-7230-7218 | |
| dc.date.accessioned | 2021-11-22T09:17:28Z | |
| dc.date.available | 2021-11-02T16:05:40Z | |
| dc.date.available | 2021-11-22T09:17:28Z | |
| dc.date.issued | 2020 | |
| dc.identifier.eisbn | 978-1-7281-3199-3 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38224 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | APR 28-MAY 30, 2020 | |
| dc.source.conferencelocation | Dallas, TX, USA | |
| dc.source.journal | na | |
| dc.source.numberofpages | 6 | |
| dc.title | Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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