Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Novel flexible and cost-effective retention assessment method for TMO-based RRAM
Publication:
Novel flexible and cost-effective retention assessment method for TMO-based RRAM
Date
2016
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
33395.pdf
730.08 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Michael
;
Fantini, Andrea
;
Goux, Ludovic
;
Gorine, Georgi
;
Redolfi, Augusto
;
Groeseneken, Guido
;
Jurczak, Gosia
Journal
IEEE Electron Device Letters
Abstract
Description
Metrics
Views
1881
since deposited on 2021-10-23
Acq. date: 2025-10-26
Citations
Metrics
Views
1881
since deposited on 2021-10-23
Acq. date: 2025-10-26
Citations