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Sensitivity based statistical analysis of circuit parameters obtained from a quasi-TEM analysis of multiconductor transmission lines
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Sensitivity based statistical analysis of circuit parameters obtained from a quasi-TEM analysis of multiconductor transmission lines
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Date
1997
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Laermans, Eric
;
Olyslager, Frank
;
De Zutter, Daniel
Journal
Journal of Electromagnetic Waves and Applications
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1805
since deposited on 2021-09-30
Acq. date: 2025-12-16
Citations
Metrics
Views
1805
since deposited on 2021-09-30
Acq. date: 2025-12-16
Citations