Publication:

Physical insights on steep slope FEFETs including nucleation-propagation and charge trapping

Date

2019
Proceedings Paper
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dc.contributor.authorXiang, Yang
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorAlam, Md Nur Kutubul
dc.contributor.authorThesberg, Mischa
dc.contributor.authorKaczer, Ben
dc.contributor.authorRoussel, Philippe
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorTruijen, Brecht
dc.contributor.authorVerhulst, Anne
dc.contributor.authorParvais, Bertrand
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorXiang, Yang
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorAlam, Md Nur Kutubul
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorTruijen, Brecht
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecXiang, Yang::0000-0003-0091-6935
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecTruijen, Brecht::0000-0002-2288-1414
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecVan Houdt, Jan::1234-1234-1234-1235
dc.date.accessioned2021-10-27T23:49:17Z
dc.date.available2021-10-27T23:49:17Z
dc.date.embargo9999-12-31
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34466
dc.source.beginpage510
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedate7/12/2019
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage513
dc.title

Physical insights on steep slope FEFETs including nucleation-propagation and charge trapping

dc.typeProceedings paper
dspace.entity.typePublication
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