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Blank defect coverage budget for 16nm half-pitch single EUV exposure
Publication:
Blank defect coverage budget for 16nm half-pitch single EUV exposure
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Date
2018
Proceedings Paper
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37728.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jonckheere, Rik
;
Yamane, Takeshi
;
Morikawa, Yasutaka
;
Kamo, Takashi
Journal
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Views
1906
since deposited on 2021-10-25
1
last month
1
last week
Acq. date: 2025-12-15
Citations