Publication:
A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress
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1985 since deposited on 2021-10-01
1last month
Acq. date: 2025-12-07
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Metrics
Views
1985 since deposited on 2021-10-01
1last month
Acq. date: 2025-12-07
Citations