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Full quantum mechanical model for the charge distribution and the leakage currents in ultra-thin metal-insulator-semiconductor capacitors

Date

2000
Journal article
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dc.contributor.authorMagnus, Wim
dc.contributor.authorSchoenmaker, Wim
dc.contributor.imecauthorMagnus, Wim
dc.date.accessioned2021-10-14T13:19:08Z
dc.date.available2021-10-14T13:19:08Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4554
dc.source.beginpage5833
dc.source.endpage5842
dc.source.issue10
dc.source.journalJournal of Applied Physics
dc.source.volume88
dc.title

Full quantum mechanical model for the charge distribution and the leakage currents in ultra-thin metal-insulator-semiconductor capacitors

dc.typeJournal article
dspace.entity.typePublication
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