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Origins and implications of increased channel hot carrier variability in nFinFETs
Publication:
Origins and implications of increased channel hot carrier variability in nFinFETs
Date
2015
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Franco, Jacopo
;
Cho, Moon Ju
;
Grasser, Tibor
;
Roussel, Philippe
;
Tyaginov, Stanislav
;
Bina, Markus
;
Wimmer, Y.
;
Procel, L. M.
;
Trojman, Lionel
;
Crupi, Felice
;
Pitner, Gregory
;
Putcha, Vamsi
;
Weckx, Pieter
;
Bury, Erik
;
Ji, Z.
;
De Keersgieter, An
;
Chiarella, Thomas
;
Horiguchi, Naoto
;
Groeseneken, Guido
;
Thean, Aaron
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1877
since deposited on 2021-10-22
Acq. date: 2025-10-26
Citations
Metrics
Views
1877
since deposited on 2021-10-22
Acq. date: 2025-10-26
Citations