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Practical accuracy analysis of some existing effective channel length and series resistance extraction methods for MOSFET's

Date

1998
Journal article
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dc.contributor.authorBiesemans, Serge
dc.contributor.authorHendriks, Marton
dc.contributor.authorKubicek, Stefan
dc.contributor.authorDe Meyer, Kristin
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.imecauthorKubicek, Stefan
dc.contributor.imecauthorDe Meyer, Kristin
dc.date.accessioned2021-09-30T11:28:31Z
dc.date.available2021-09-30T11:28:31Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2399
dc.source.beginpage1310
dc.source.endpage1316
dc.source.issue6
dc.source.journalIEEE Trans. Electron Devices
dc.source.volume45
dc.title

Practical accuracy analysis of some existing effective channel length and series resistance extraction methods for MOSFET's

dc.typeJournal article
dspace.entity.typePublication
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