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50 nm Gate Length FinFET Biosensor & the Outlook for Single-Molecule Detection

 
dc.contributor.authorSantermans, Sybren
dc.contributor.authorBarge, David
dc.contributor.authorHellings, Geert
dc.contributor.authorBergfeld Mori, Carlos
dc.contributor.authorMigacz, Konrad Joseph
dc.contributor.authorRip, Jens
dc.contributor.authorSpampinato, Valentina
dc.contributor.authorVos, Rita
dc.contributor.authorDu Bois, Bert
dc.contributor.authorRay Chaudhuri, Ashesh
dc.contributor.authorMartino, J. A.
dc.contributor.authorHeyns, Marc
dc.contributor.authorSeveri, Simone
dc.contributor.authorVan Roy, Wim
dc.contributor.authorMartens, Koen
dc.contributor.imecauthorSantermans, S.
dc.contributor.imecauthorBarge, D.
dc.contributor.imecauthorMigacz, K. J.
dc.contributor.imecauthorRip, J.
dc.contributor.imecauthorSpampinato, V
dc.contributor.imecauthorVos, R.
dc.contributor.imecauthorDu Bois, B.
dc.contributor.imecauthorChaudhuri, A. R.
dc.contributor.imecauthorHeyns, M.
dc.contributor.imecauthorSeveri, S.
dc.contributor.imecauthorVan Roy, W.
dc.contributor.imecauthorMartens, K.
dc.contributor.imecauthorSantermans, Sybren
dc.contributor.imecauthorBarge, David
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorBergfeld Mori, Carlos
dc.contributor.imecauthorMigacz, Konrad Joseph
dc.contributor.imecauthorRip, Jens
dc.contributor.imecauthorSpampinato, Valentina
dc.contributor.imecauthorVos, Rita
dc.contributor.orcidimecSantermans, Sybren::0000-0002-0843-102X
dc.contributor.orcidimecBarge, David::0000-0002-1251-504X
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecSpampinato, Valentina::0000-0003-3225-6740
dc.contributor.orcidimecDu Bois, Bert::0000-0003-0147-1296
dc.contributor.orcidimecVan Roy, Wim::0000-0003-3232-1987
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.date.accessioned2021-12-09T11:31:49Z
dc.date.available2021-12-06T02:06:36Z
dc.date.available2021-12-09T11:31:49Z
dc.date.issued2020
dc.identifier.doi10.1109/IEDM13553.2020.9371908
dc.identifier.eisbn978-1-7281-8888-1
dc.identifier.issn2380-9248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38555
dc.publisherIEEE
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 12-18, 2020
dc.source.conferencelocationSan Francisco, CA, USA
dc.source.journalna
dc.source.numberofpages4
dc.title

50 nm Gate Length FinFET Biosensor & the Outlook for Single-Molecule Detection

dc.typeProceedings paper
dspace.entity.typePublication
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