Publication:
Dynamics of threshold voltage instability in stacked high-k dielectrics: role of the interfacial oxide
Date
Loading...
Journal
Abstract
Description
Statistics
Views
2084 since deposited on 2021-10-15
3last month
1last week
Acq. date: 2026-05-02
Citations
Statistics
Views
2084 since deposited on 2021-10-15
3last month
1last week
Acq. date: 2026-05-02
Citations