Publication:
Dynamics of threshold voltage instability in stacked high-k dielectrics: role of the interfacial oxide
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2088 since deposited on 2021-10-15
4last month
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Acq. date: 2026-08-07
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Statistics
Views
2088 since deposited on 2021-10-15
4last month
2last week
Acq. date: 2026-08-07
Citations