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Dynamics of threshold voltage instability in stacked high-k dielectrics: role of the interfacial oxide
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2081 since deposited on 2021-10-15
1last month
Acq. date: 2026-04-05
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Statistics
Views
2081 since deposited on 2021-10-15
1last month
Acq. date: 2026-04-05
Citations