Publication:

Densely Integrated Phase Interrogators for Low-Complexity On-Chip Calibration of Optical Phased Arrays

Date

2022
Journal article
https://doi.org/10.1109/JLT.2022.3179437
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dc.contributor.authorKjellman, Jon
dc.contributor.authorProst, Mathias
dc.contributor.authorMarinins, Aleksandrs
dc.contributor.authorTyagi, Hemant Kumar
dc.contributor.authorKongnyuy, Tangla David
dc.contributor.authorDwivedi, Sarvagya Paavan
dc.contributor.authorDahlem, Marcus
dc.contributor.authorSoussan, Philippe
dc.contributor.authorRottenberg, Xavier
dc.contributor.authorJansen, Roelof
dc.contributor.imecauthorKjellman, Jon
dc.contributor.imecauthorProst, Mathias
dc.contributor.imecauthorMarinins, Aleksandrs
dc.contributor.imecauthorTyagi, Hemant Kumar
dc.contributor.imecauthorKongnyuy, Tangla David
dc.contributor.imecauthorDwivedi, Sarvagya Paavan
dc.contributor.imecauthorDahlem, Marcus
dc.contributor.imecauthorSoussan, Philippe
dc.contributor.imecauthorRottenberg, Xavier
dc.contributor.imecauthorJansen, Roelof
dc.contributor.orcidimecMarinins, Aleksandrs::0000-0002-0728-6684
dc.contributor.orcidimecKongnyuy, Tangla David::0000-0001-9063-7555
dc.contributor.orcidimecSoussan, Philippe::0000-0002-1347-6978
dc.contributor.orcidimecRottenberg, Xavier::0000-0003-0920-1709
dc.contributor.orcidimecJansen, Roelof::0000-0001-6685-4699
dc.contributor.orcidimecKjellman, Jon::0000-0002-9073-4344
dc.contributor.orcidimecDwivedi, Sarvagya Paavan::0000-0003-1184-3225
dc.contributor.orcidimecDahlem, Marcus::0000-0002-1373-6709
dc.date.accessioned2023-04-28T07:43:06Z
dc.date.available2022-08-24T02:35:03Z
dc.date.available2023-04-28T07:43:06Z
dc.date.issued2022
dc.identifier.doi10.1109/JLT.2022.3179437
dc.identifier.issn0733-8724
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40293
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage5660
dc.source.endpage5667
dc.source.issue16
dc.source.journalJOURNAL OF LIGHTWAVE TECHNOLOGY
dc.source.numberofpages8
dc.source.volume40
dc.title

Densely Integrated Phase Interrogators for Low-Complexity On-Chip Calibration of Optical Phased Arrays

dc.typeJournal article
dspace.entity.typePublication
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