Publication:

Progressive vs. abrupt reset behavior in conductive bridging devices : a C-AFM tomography study

Date

2014
Proceedings Paper
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dc.contributor.authorCelano, Umberto
dc.contributor.authorGoux, Ludovic
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorGiammaria, Guido
dc.contributor.authorOpsomer, Karl
dc.contributor.authorDetavernier, Christophe
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorIrrera, Fernanda
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.date.accessioned2021-10-22T00:53:13Z
dc.date.available2021-10-22T00:53:13Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23615
dc.source.beginpage351
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate15/12/2014
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage354
dc.title

Progressive vs. abrupt reset behavior in conductive bridging devices : a C-AFM tomography study

dc.typeProceedings paper
dspace.entity.typePublication
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