Publication:

ESD Challenges in sub-10nm CMOS technologies

Date

2016
Proceedings Paper
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dc.contributor.authorChen, Shih-Hung
dc.contributor.authorLinten, Dimitri
dc.contributor.authorScholz, Mirko
dc.contributor.authorHellings, Geert
dc.contributor.authorBoschke, Roman
dc.contributor.authorHoriguchi, Naoto
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.accessioned2021-10-23T10:16:46Z
dc.date.available2021-10-23T10:16:46Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26436
dc.source.conferenceTaiwan ESD and Reliability Conference
dc.source.conferencedate31/10/2016
dc.source.conferencelocationHsinchu Taiwan
dc.title

ESD Challenges in sub-10nm CMOS technologies

dc.typeProceedings paper
dspace.entity.typePublication
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