Publication:

Injection and trapping of electrons in Y2O3 layers on Si

Date

2010
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorWang, Mugwort
dc.contributor.authorBadylevich, M.
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorStesmans, Andre
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorKittl, Jorge
dc.contributor.authorLukosius, M.
dc.contributor.authorWalczyk, C.
dc.contributor.authorWenger, C.
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorStesmans, Andre
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.date.accessioned2021-10-19T00:19:38Z
dc.date.available2021-10-19T00:19:38Z
dc.date.issued2010
dc.identifier.issn1757-8981
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18337
dc.source.beginpage12028
dc.source.issue1
dc.source.journalIOP Conference Series: Materials Science and Engineering
dc.source.volume8
dc.title

Injection and trapping of electrons in Y2O3 layers on Si

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles