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Scatterometry and AFM measurement combination for area selective deposition process characterization
Publication:
Scatterometry and AFM measurement combination for area selective deposition process characterization
Date
2019
Proceedings Paper
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43084.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Saib, Mohamed
;
Moussa, Alain
;
Charley, Anne-Laure
;
Leray, Philippe
;
Hung, Joey
;
Koret, Roy
;
Turovets, Igor
;
Ger, Avron
;
Deng, Shaoren
;
Illiberi, Andrea
;
Maes, Jan Willem
;
Woodworth, Gabriel
;
Strauss, Michael
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Abstract
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2023
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations
Metrics
Views
2023
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations