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Articles
Process induced sub-surface damage in mechanically ground silicon wafers
Publication:
Process induced sub-surface damage in mechanically ground silicon wafers
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Date
2008-07
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yang, Yu
;
De Munck, Koen
;
Cotrin Teixeira, Ricardo
;
Swinnen, Bart
;
Verlinden, Bert
;
De Wolf, Ingrid
Journal
Semiconductor Science and Technology
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1934
since deposited on 2021-10-17
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Acq. date: 2025-12-11
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Metrics
Views
1934
since deposited on 2021-10-17
2
last month
1
last week
Acq. date: 2025-12-11
Citations