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Process optimization and integration of trimethylsilane deposited a-SiC:H and SiOC:H dielectric thin films for damascene processing
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Process optimization and integration of trimethylsilane deposited a-SiC:H and SiOC:H dielectric thin films for damascene processing
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Date
2000
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gray, William
;
Loboda, M.
;
Struyf, Herbert
;
Van Hove, Marleen
;
Donaton, R. A.
;
Sleeckx, Erik
;
Stucchi, Michele
;
Gao, Teng
;
Boullart, Werner
;
Coenegrachts, Bart
;
Maenhoudt, Mireille
;
Vanhaelemeersch, Serge
;
Meynen, Herman
;
Maex, Karen
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2003
since deposited on 2021-10-14
Acq. date: 2025-12-10
Citations
Metrics
Views
2003
since deposited on 2021-10-14
Acq. date: 2025-12-10
Citations