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ABI tool performance confirmation by NXE3300 printing results for native EUV blank defects at 16nm half pitch
Publication:
ABI tool performance confirmation by NXE3300 printing results for native EUV blank defects at 16nm half pitch
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Date
2016-11
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jonckheere, Rik
;
Yamane, Takeshi
;
Takagi, Noriaki
;
Watanabe, Hidehiro
;
Beral, Christophe
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1965
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Acq. date: 2025-12-16
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Metrics
Views
1965
since deposited on 2021-10-23
2
last month
1
last week
Acq. date: 2025-12-16
Citations