Publication:

Security and reliability: friend or foe?

Date

2019
Proceedings Paper
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dc.contributor.authorVerbauwhede, Ingrid
dc.contributor.authorChuang, Kent
dc.contributor.imecauthorChuang, Kent
dc.date.accessioned2021-10-27T22:22:01Z
dc.date.available2021-10-27T22:22:01Z
dc.date.embargo9999-12-31
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34350
dc.identifier.urlhttps://ieee-iedm.org/wp-content/uploads/2019/10/session-13.pdf
dc.source.beginpage290
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate7/12/2019
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage293
dc.title

Security and reliability: friend or foe?

dc.typeProceedings paper
dspace.entity.typePublication
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