Publication:

Defects, junction leakage and electrical performance of Ge pFET devices

Date

2009
Proceedings Paper
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Author(s)

Eneman, Geert  
;
Simoen, Eddy  
;
Yang, Rui
;
De Jaeger, Brice  
;
Wang, Gang
;
Mitard, Jerome  
;
Hellings, Geert  
;
Brunco, David
;
Loo, Roger  
;
De Meyer, Kristin  
;
Caymax, Matty  
;
Claeys, Cor
;
Meuris, Marc  
;
Heyns, Marc  

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1923 since deposited on 2021-10-17
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1923 since deposited on 2021-10-17
Acq. date: 2025-12-08

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