Publication:

Understanding the Cycling-Dependent Threshold Voltage Instability in OTS Devices

Date

2022
Proceedings Paper
https://doi.org/10.1109/IEDM45625.2022.10019444
Simple item page Full metadata Statistics
 
dc.contributor.authorYamaguchi, Marina
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGarbin, Daniele
dc.contributor.authorClima, Sergiu
dc.contributor.authorRavsher, Taras
dc.contributor.authorMatsubayashi, Daisuke
dc.contributor.authorTsukamoto, Takayuki
dc.contributor.authorDelhougne, Romain
dc.contributor.authorGoux, Ludovic
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorYamaguchi, Marina
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorRavsher, Taras
dc.contributor.imecauthorMatsubayashi, Daisuke
dc.contributor.imecauthorTsukamoto, Takayuki
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecRavsher, Taras::0000-0001-7862-5973
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2023-06-26T14:40:34Z
dc.date.available2023-05-25T20:20:01Z
dc.date.available2023-06-26T14:40:34Z
dc.date.issued2022
dc.identifier.doi10.1109/IEDM45625.2022.10019444
dc.identifier.eisbn978-1-6654-8959-1
dc.identifier.issn2380-9248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41622
dc.publisherIEEE
dc.source.conferenceInternational Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 03-07, 2022
dc.source.conferencelocationSan Francisco
dc.source.journalna
dc.source.numberofpages4
dc.title

Understanding the Cycling-Dependent Threshold Voltage Instability in OTS Devices

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions