Publication:
6Å EOT Si0.45Ge0.55 pMOSFET with optimized reliability (VDD=1V): Meeting the NBTI lifetime target at ultra-thin EOT
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Downloads
1 since deposited on 2021-10-18
Acq. date: 2026-04-07
Views
2087 since deposited on 2021-10-18
1last month
Acq. date: 2026-04-07
Citations
Statistics
Downloads
1 since deposited on 2021-10-18
Acq. date: 2026-04-07
Views
2087 since deposited on 2021-10-18
1last month
Acq. date: 2026-04-07
Citations