Publication:
A new ultra-thin 3D integration technique: technological and thermal investigations
Date
| dc.contributor.author | Pinel, Stephane | |
| dc.contributor.author | Tasselli, Josiane | |
| dc.contributor.author | Marty, Antoine | |
| dc.contributor.author | Bailbe, Jean-Pierre | |
| dc.contributor.author | Beyne, Eric | |
| dc.contributor.author | Van Hoof, Rita | |
| dc.contributor.author | Marco, Santiago | |
| dc.contributor.author | Leseduarte, Sergio | |
| dc.contributor.author | Vendier, Olivier | |
| dc.contributor.author | Coello Vera, Augustin | |
| dc.contributor.imecauthor | Beyne, Eric | |
| dc.contributor.imecauthor | Van Hoof, Rita | |
| dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
| dc.date.accessioned | 2021-10-14T14:28:07Z | |
| dc.date.available | 2021-10-14T14:28:07Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4991 | |
| dc.source.beginpage | 324 | |
| dc.source.conference | Design, Test, Integration, and Packaging of MEMS/MOEMS | |
| dc.source.conferencedate | 9/05/2000 | |
| dc.source.conferencelocation | Paris France | |
| dc.source.endpage | 332 | |
| dc.title | A new ultra-thin 3D integration technique: technological and thermal investigations | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |