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Conference contributions
Parameter extraction, variability analysis and yield prediction of the photonic integrated circuits
Publication:
Parameter extraction, variability analysis and yield prediction of the photonic integrated circuits
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Date
2019
Proceedings Paper
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43401.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Khan, Muhammad Umar
;
Xing, Yufei
;
Bogaerts, Wim
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1933
since deposited on 2021-10-27
Acq. date: 2026-01-06
Citations
Metrics
Views
1933
since deposited on 2021-10-27
Acq. date: 2026-01-06
Citations