Circuit interpretation and perturbative analysis of differential-to-common mode conversion due to bend discontinuities

dc.contributor.author	Wu, X.
dc.contributor.author	Grassi, F.
dc.contributor.author	Pignari, S.A.
dc.contributor.author	Manfredi, Paolo
dc.contributor.author	Vande Ginste, Dries
dc.contributor.imecauthor	Vande Ginste, Dries
dc.contributor.orcidimec	Vande Ginste, Dries::0000-0002-0178-288X
dc.date.accessioned	2021-10-26T09:43:24Z
dc.date.available	2021-10-26T09:43:24Z
dc.date.embargo	9999-12-31
dc.date.issued	2018
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/32292
dc.identifier.url	http://ieeexplore.ieee.org/document/8276966/
dc.source.beginpage	1
dc.source.conference	IEEE Electrical Design of Advanced Packaging and Systems Symposium - EDAPS
dc.source.conferencedate	14/12/2017
dc.source.conferencelocation	Hangzhou China
dc.source.endpage	3
dc.title	Circuit interpretation and perturbative analysis of differential-to-common mode conversion due to bend discontinuities
dc.type	Proceedings paper
dspace.entity.type	Publication
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