Publication:

Materials and electrical characterization of molecular beam deposited CeO2

Date

2007-07
Journal article
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dc.contributor.authorBrunco, David
dc.contributor.authordimoulas, A.
dc.contributor.authorBoukos, N.
dc.contributor.authorHoussa, Michel
dc.contributor.authorConard, Thierry
dc.contributor.authorMartens, Koen
dc.contributor.authorZhao, Chao
dc.contributor.authorBellenger, Florence
dc.contributor.authorCaymax, Matty
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.accessioned2021-10-16T15:12:08Z
dc.date.available2021-10-16T15:12:08Z
dc.date.issued2007-07
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11815
dc.source.beginpage24104
dc.source.issue2
dc.source.journalJournal of Applied Physics
dc.source.volume102
dc.title

Materials and electrical characterization of molecular beam deposited CeO2

dc.typeJournal article
dspace.entity.typePublication
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