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TEM sample preparation by FIB for carbon nanotube interconnects
Publication:
TEM sample preparation by FIB for carbon nanotube interconnects
Date
2009
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ke, Xiaoxing
;
Bals, Sara
;
Romo Negreira, Ainhoa
;
Hantschel, Thomas
;
Bender, Hugo
;
Van Tendeloo, Gustaaf
Journal
Ultramicroscopy
Abstract
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1930
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1930
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations