Publication:

Radiation damage in Si1-xGex heteroepitaxial devices

Date

1999
Journal article
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dc.contributor.authorOhyama, Hidenori
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorHayama, Kiyoteru
dc.contributor.authorTokuyama, J.
dc.contributor.authorTakami, Y.
dc.contributor.authorSunaga, H.
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-14T11:32:46Z
dc.date.available2021-10-14T11:32:46Z
dc.date.embargo9999-12-31
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3725
dc.source.beginpage351
dc.source.endpage355
dc.source.issue2
dc.source.journalJournal of Radioanalytical and Nuclear Chemistry
dc.source.volume239
dc.title

Radiation damage in Si1-xGex heteroepitaxial devices

dc.typeJournal article
dspace.entity.typePublication
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