Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Presentations
Double litho, double etch (LELE) process challenges for 22nm HP and beyond
Publication:
Double litho, double etch (LELE) process challenges for 22nm HP and beyond
Copy permalink
Date
2008
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
17803.pdf
2.32 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Maenhoudt, Mireille
;
Wiaux, Vincent
;
Cheng, Shaunee
;
Vandenberghe, Geert
;
Ronse, Kurt
Journal
Abstract
Description
Metrics
Views
1907
since deposited on 2021-10-17
Acq. date: 2025-12-16
Citations
Metrics
Views
1907
since deposited on 2021-10-17
Acq. date: 2025-12-16
Citations