Publication:

Model and parameter extraction strategy impact on the estimated values of MOSFET parameters in ohmic operation

Date

2026-01-01
Journal article
https://doi.org/10.1016/j.sse.2025.109247
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-5218-4046
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtualsource.department715a9ada-0798-46d2-a8ca-4775db9a8e46
cris.virtualsource.departmentbd265d49-9bfb-424d-adea-35c86526f50d
cris.virtualsource.orcid715a9ada-0798-46d2-a8ca-4775db9a8e46
cris.virtualsource.orcidbd265d49-9bfb-424d-adea-35c86526f50d
dc.contributor.authorTahiat, A.
dc.contributor.authorCretu, B.
dc.contributor.authorVeloso, Anabela
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2026-01-13T10:32:58Z
dc.date.available2026-01-13T10:32:58Z
dc.date.createdwos2025-11-03
dc.date.issued2026-01-01
dc.identifier.doi10.1016/j.sse.2025.109247
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/58636
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.beginpage109247
dc.source.issueJanuary
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.numberofpages7
dc.source.volume231
dc.subject.keywordsCARRIER MOBILITY
dc.subject.keywordsGATE
dc.title

Model and parameter extraction strategy impact on the estimated values of MOSFET parameters in ohmic operation

dc.typeJournal article
dspace.entity.typePublication
imec.identified.statusLibrary
imec.internal.crawledAt2025-10-22
imec.internal.sourcecrawler
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