Publication:
Characteristic impedance extraction using calibration comparison
Date
| dc.contributor.author | Vandenberghe, S. | |
| dc.contributor.author | Schreurs, Dominique | |
| dc.contributor.author | Carchon, Geert | |
| dc.contributor.author | Nauwelaers, Bart | |
| dc.contributor.author | De Raedt, Walter | |
| dc.contributor.imecauthor | Schreurs, Dominique | |
| dc.contributor.imecauthor | Nauwelaers, Bart | |
| dc.contributor.imecauthor | De Raedt, Walter | |
| dc.contributor.orcidimec | De Raedt, Walter::0000-0002-7117-7976 | |
| dc.date.accessioned | 2021-10-14T18:10:45Z | |
| dc.date.available | 2021-10-14T18:10:45Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5769 | |
| dc.source.beginpage | 2573 | |
| dc.source.endpage | 2579 | |
| dc.source.issue | 12 | |
| dc.source.journal | IEEE Trans. Microwave Theory and Techniques | |
| dc.source.volume | 49 | |
| dc.title | Characteristic impedance extraction using calibration comparison | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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