Publication:
Relation between breakdown mode and location in short-channel nMOSFETs and its impact on reliability specifications
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1898 since deposited on 2021-10-14
4last month
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Acq. date: 2025-12-15
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Views
1898 since deposited on 2021-10-14
4last month
1last week
Acq. date: 2025-12-15
Citations